9 results
miniSCIDOM: a scintillator-based tomograph for volumetric dose reconstruction of single laser-driven proton bunches
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- Journal:
- High Power Laser Science and Engineering / Volume 12 / 2024
- Published online by Cambridge University Press:
- 23 January 2024, e17
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OCTOPOD: single-bunch tomography for angular-spectral characterization of laser-driven protons
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- High Power Laser Science and Engineering / Volume 11 / 2023
- Published online by Cambridge University Press:
- 04 July 2023, e68
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Three-dimensional acoustic monitoring of laser-accelerated protons in the focus of a pulsed-power solenoid lens
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- High Power Laser Science and Engineering / Volume 11 / 2023
- Published online by Cambridge University Press:
- 23 February 2023, e38
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Targets for high repetition rate laser facilities: needs, challenges and perspectives
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- High Power Laser Science and Engineering / Volume 5 / 2017
- Published online by Cambridge University Press:
- 24 July 2017, e17
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Advantages of a Local Charge Compensation System for FIB/SEM Applications on Insulating Materials
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 332-333
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- July 2009
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Development of an Ion Optical System to transfer Secondary Ions from the Sample to an Ion Trap Mass Spectrometer
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- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
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- 07 September 2007, pp. 16-17
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- September 2007
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Looking Into van Gogh¡¦s Paintings with Focused Ion Beam (FIB)
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1256-1257
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- August 2006
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Real time SEM imaging of FIB milling processes for extended accuracy in Cross Sectioning and TEM Preparation
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- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
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- 05 September 2003, pp. 524-525
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- September 2003
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Focused Ion Beam Preparation Techniques for EFTEM Analysis
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 872-873
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- August 2003
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